NF ISO 23830:2009 表面化學(xué)分析 二次離子質(zhì)譜 二次離子靜態(tài)質(zhì)譜中相對強度標(biāo)度的重復(fù)性和穩(wěn)定性
Chemical analysis of surfaces - Mass spectrometry of secondary ions - Repeatability and constancy of the scale of relative intensities in static mass spectrometry of secondary ions