KS C IEC 61360-2:2011 電氣元器件標(biāo)準(zhǔn)數(shù)據(jù)元素類型和相關(guān)分類模式.第2部分:EXPRESS詞典模式

? ??? ? ?? ?? ??? KS C IEC 61360-1? KS B ISO 13584

Standard data element types with associated classification scheme for electric components-Part 2:EXPRESS dictionary schema

BS EN 60068-2-83:2011 環(huán)境檢測.檢測.檢測Tf:使用焊錫膏潤濕平衡法對表面安裝器具(SMD)進(jìn)行電子元件的焊錫性試驗(yàn)

Environmental testing. Tests. Test Tf: Solderability testing of electronic components for surface mounting devices (SMD) by the wetting balance method using solder paste

IEC 62137-3:2011 電子裝配工藝.第3部分:焊接接縫環(huán)境和耐久性試驗(yàn)法選擇指南

This part of IEC 62137 describes the selection methodology of an appropriate test method for a reliability test for solder joints of various shapes and types of surface mount devices (SMD)@ array type devices and leaded devices@ and lead insertion type devices using various types of solder material alloys.

Electronics assembly technology - Part 3: Selection guidance of environmental and endurance test methods for solder joints

IEC 60068-2-83:2011 環(huán)境試驗(yàn).第2-83部分:測試.測試Tf:利用焊錫膏潤濕平衡法進(jìn)行的表面安裝裝置(SMD)電子元件的焊接性試驗(yàn)

This part of IEC 60068 provides methods for comparative investigation of the wettability of the metallic terminations or metallized terminations of SMDs with solder pastes. Data obtained by these methods are not intended to be used as absolute quantitative data for pass ?C fail purposes. NOTE Different solderability test methods for SMD are described in IEC 60068-2-58 and IEC 60068-2-69. IEC 60068-2-58 prescribes visual evaluation using solder bath and reflow method@ IEC 60068-2-69 prescribes wetting balance evaluation using solder bath and solder globule method.

Environmental Testing - Part 2-83: Tests - Test Tf: Solderability testing of electronic components for surface mounting devices (SMD) by the wetting balance method using solder paste

YD/T 2122-2011 2GHz TD-SCDMA數(shù)字蜂窩移動通信網(wǎng).無線操作維護(hù)中心（OMC-R）測量報(bào)告技術(shù)要求

本標(biāo)準(zhǔn)規(guī)定了TD-SCDMA數(shù)字蜂窩移動通信網(wǎng)無線操作維護(hù)中心（OMC-R)提供的無線測量報(bào)告的數(shù)據(jù)內(nèi)容和格式要求。 本標(biāo)準(zhǔn)適用于TD-SCDMA數(shù)字蜂窩移動通信網(wǎng)無線操作維護(hù)中心無線測量報(bào)告。

2GHZTD-SCDMA digital cell mobile communications network OMC-R measurement report technical specification

IEEE 1680/INT 1-2-2011 電子產(chǎn)品的環(huán)境評定

Environmental Assessment of Electronic Products (IEEE Computer Society)

DIN EN 61508-7:2011 電氣/電子/可編程序電子安全相關(guān)系統(tǒng)的功能安全.第7部分:技術(shù)和措施綜述(IEC 61508-7-2010);德文版本EN 61508-7-2010

Functional safety of electrical/electronic/programmable electronic safety-related systems - Part 7: Overview of techniques and measures (IEC 61508-7:2010); German version EN 61508-7:2010

ANSI/UL 60950-1-2011 信息技術(shù)設(shè)備安全標(biāo)準(zhǔn).安全性.第1部分:一般要求

Proposals to: 1. Align with IEC 60950-1, Amendment 1; 2. Revise Acoustic Limits; 3. Annexes P.1, NAE - Add UL 50E and CSA No. 94.2; 4. Annex P.1 - Add UL 2089; 5. Annex P.1 - Add UL 810A; 6. Annexes P.1, P.2 - Modify VDR/TVSS/SPD Requirements; 7. Annex P.1 - Revise Requirements for Connectors Used for Current Interruption; 8. Annexes P.1, P.2 - Editorial Maintenance; 9. Annex NAE - Minimum AC Power Cord Length for Products Using AC Adapters; 10. Annex NAE - Premises-Powered Broadband Communication Systems; 11. Update NEC/CEC References; 12. Update Tables 2D and 3E; 13. Annex P.2 - Add UL 60384-14.

Standard for Safety for Information Technology Equipment - Safety - Part 1: General Requirements

ANSI/UL 60950-1a-2011 信息技術(shù)設(shè)備安全標(biāo)準(zhǔn).安全性.第1部分:一般要求

Recirculation of the following: proposed revisions to align with Amendment 1 to IEC 60950-1, additional proposal for Table 1D; proposal to revise the acoustic limits in UL 60950-1 (Annex NAD); and Annex NAE (3.2.5) - minimum AC power cord length for certain products using AC adapters.

Standard for Safety for Information Technology Equipment - Safety - Part 1: General Requirements

ASTM F1263-11 電子元件輻射試驗(yàn)中超量試驗(yàn)數(shù)據(jù)分析的標(biāo)準(zhǔn)指南

Overtesting should be done when (a) testing by variables is impractical because of time and cost considerations or because the probability distribution of stress to failure cannot be estimated with sufficient accuracy, and (b) an unrealistically large number of parts would have to be tested at the specification stress for the necessary confidence and survival probability.1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress level higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary, although exact knowledge may be replaced by over-conservative estimates of this distribution.

Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

ANSI/IEEE 1490:2011 指南:項(xiàng)目管理協(xié)會(PMI)標(biāo)準(zhǔn)的采用:項(xiàng)目管理知識體系指南(PMBOK指南).2008年(第4版)

Guide: Adoption of the Project Management Institute (PMI) Standard: A Guide to the Project Management Body of Knowledge (PMBOK Guide) - 2008 (4th edition)

ANSI/IEEE 1658:2011 數(shù)字模擬轉(zhuǎn)換器設(shè)備的檢測方法和術(shù)語標(biāo)準(zhǔn)

Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices

IEEE 1490-2011 指南.項(xiàng)目管理協(xié)會(PMI)標(biāo)準(zhǔn)的采用.項(xiàng)目管理知識體系指南(PMBOK? Guide).第4版

Guide - Adoption of the Project Management Institute (PMI?) Standard - A Guide to the Project Management Body of Knowledge (PMBOK? Guide) - Fourth Edition

DB13/T 1323-2010 LED加速壽命試驗(yàn)方法

本標(biāo)準(zhǔn)規(guī)定了LED加速壽命試驗(yàn)的定義、試驗(yàn)準(zhǔn)備、試驗(yàn)步驟、試驗(yàn)數(shù)據(jù)的處理、結(jié)果的計(jì)算。本標(biāo)準(zhǔn)適用于各種可見和非可見單色光LED器件產(chǎn)品光輸出功率緩慢退化失效模式的LED加速壽命試驗(yàn)。對于不考慮色溫漂移的白光LED器件產(chǎn)品，可以參照本標(biāo)準(zhǔn)。

LED Accelerated Life Test Method

BS CWA 16213:2010 最終用戶電子技能框架要求

End user e-skills framework requirements

SAE J2556-2010 輻射(RE)窄頻帶數(shù)據(jù)分析功率譜密度(PSD)

This SAE Information Report defines a procedure for indicating the severity of narrowband emissions from an electronic system-component.

Radiated Emissions (RE) Narrowband Data Analysis Power Spectral Density (PSD)

IEC 61340-5-3:2010 靜電學(xué).第5-3部分:靜電現(xiàn)象中電子設(shè)備的保護(hù).靜電放電敏感設(shè)備的封裝用性能和要求分類

This part of IEC 61340 defines the ESD protective packaging properties needed to protect electrostatic discharge sensitive devices (ESDS) through all phases of production, transport and storage. Test methods are referenced to evaluate packaging and packaging materials for these product and material properties. Performance limits are provided. This standard does not address protection from electromagnetic interference (EMI), radio frequency interference (RFI), electromagnetic pulsing (EMP) nor protection of volatile materials.

Electrostatics - Part 5-3: Protection of electronic devices from electrostatic phenomena - Properties and requirements classification for packaging intended for electrostatic discharge sensitive devices

ASTM E2377-10 輕量級電子設(shè)備屏蔽標(biāo)準(zhǔn)規(guī)范

1.1 This specification covers two types of lightweight electrical equipment shelters designed for transport on the M1152A1, M1152A1 with B2 Armor Kit, M1037, and M1097 High Mobility Multipurpose Wheeled Vehicle (HMMWV). These shelters are transported by rail, air, marine and highway when mounted or dismounted from their vehicles. 1.2 Classification8212;The shelters will be of the following types, as specified (see 6.2). 1.2.1 Type I8212;Shelter, Electrical Equipment, Lightweight (w/o Tunnel, 17-2-0035-1). 1.2.2 Type III8212;Shelter, Electrical Equipment, Lightweight, Modified, General Purpose (w/ Tunnel, 17-2-0035-3). 1.3 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard. 1.4 The following safety hazards caveat pertains only to the test required portion, Section 4, of this specification: This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory requirements prior to use.

Standard Specification for Shelter, Electrical Equipment, Lightweight

ASTM E668-10 測定電子設(shè)備在輻射硬度試驗(yàn)中的吸收劑量用熱致發(fā)光-劑量測定法(TLD)的標(biāo)準(zhǔn)應(yīng)用規(guī)程

Absorbed dose in a material is an important parameter that can be correlated with radiation effects produced in electronic components and devices that are exposed to ionizing radiation. Reasonable estimates of this parameter can be calculated if knowledge of the source radiation field (that is, energy spectrum and particle fluence) is available. Sufficiently detailed information about the radiation field is generally not available. However, measurements of absorbed dose with passive dosimeters in a radiation test facility can provide information from which the absorbed dose in a material of interest can be inferred. Under certain prescribed conditions, TLDs are quite suitable for performing such measurements. Note 28212;For comprehensive discussions of various dosimetry methods applicable to the radiation types and energy and absorbed dose-rate range discussed in this practice, see ICRU Reports 14, 17, 21, and 34.1.1 This practice covers procedures for the use of thermoluminescence dosimeters (TLDs) to determine the absorbed dose in a material irradiated by ionizing radiation. Although some elements of the procedures have broader application, the specific area of concern is radiation-hardness testing of electronic devices. This practice is applicable to the measurement of absorbed dose in materials irradiated by gamma rays, X rays, and electrons of energies from 12 to 60 MeV. Specific energy limits are covered in appropriate sections describing specific applications of the procedures. The range of absorbed dose covered is approximately from 10−2 to 104 Gy (1 to 106 rad), and the range of absorbed dose rates is approximately from 10−2 to 1010 Gy/s (1 to 1012 rad/s). Absorbed dose and absorbed dose-rate measurements in materials subjected to neutron irradiation are not covered in this practice. Further, the portion of these procedures that deal with electron irradiation are primarily intended for use in parts testing. Testing of devices as a part of more massive components such as electronics boards or boxes may require techniques outside the scope of this practice. Note 18212;The purpose of the upper and lower limits on the energy for electron irradiation is to approach a limiting case where dosimetry is simplified. Specifically, the dosimetry methodology specified requires that the following three limiting conditions be approached: (a) energy loss of the primary electrons is small, (b) secondary electrons are largely stopped within the dosimeter, and (c) bremsstrahlung radiation generated by the primary electrons is largely lost. 1.2 This standard dose not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

IEEE 1641-2010 信號和試驗(yàn)術(shù)語

Signal and test definition