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This document defines the relevant properties for coupling lightwaves into and out of integrated optical chips (IOC) and chips with photonic integrated circuits (PIC). This document mainly focuses on butt coupling via the waveguide endfaces. The definitions provide the basis for specifying the elements to be coupled (e. g. fibres, integrated optical chips) related to coupling properties.
Integrated optics - Interfaces - Parameters relevant to coupling properties
Information technology. Data centre facilities and infrastructures. Building construction
Accessibility requirements for ICT products and services (V3.2.1)
Evaluation Specifications for Green Data Centers of Public Institutions
Evaluation Specifications for Green Data Centers of Public Institutions
Blockchain technology architecture security requirements
Telecom Data Service Platform Part 7: Data Service Openness
File data security marking specification for public cloud services
Robot Interoperability Functional Rules Part 1: Sound Source Localization
本文件規(guī)定了機(jī)器人互操作體系中機(jī)器人單元與機(jī)器人單元之間,機(jī)器人單元與互操作節(jié)點(diǎn)之間以及不同互操作節(jié)點(diǎn)之間交換信息的語(yǔ)義規(guī)范、功能框架和安全機(jī)制。
Common Specification for Robot Interoperability
Specifications for the Construction and Operation of Green Data Centers for Public Institutions
To be read in conjunction with EN 50357
Product standard for human exposure to electromagnetic fields from devices operating in the frequency range 0 Hz to 300 GHz, used in Electronic Article Surveillance (EAS), Radio Frequency Identification (RFID) and similar applications
Standards for construction and management of information systems for livestock and poultry slaughtering enterprises
This part of IEC 61340, which has been developed to support IEC 61340-5-1, applies to activities that: manufacture, process, assemble, install, package, label, service, test, inspect, transport or otherwise handle electrical or electronic parts, assemblies and equipment with withstand voltages greater than or equal to 100 V HBM, 200 V CDM and 35 V for isolated conductors. Additional control elements or adjusted limits can be applicable for ESDS with lower withstand voltages. NOTE Isolated conductors were historically represented by MM.
Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide
Through silicon via geometry measurement terminology
IECEx certified service facilities scheme - Part 5: Repair, overhaul and reclamation of Ex equipment - Rules of procedure
Safety Management Specifications for Inspection and Quarantine Machine Rooms
Specifications for the design, construction and acceptance of inspection and quarantine electronic information system rooms
IECEx certified service facilities scheme - Part 3: Ex installation and initial inspection - Rules of procedure
本標(biāo)準(zhǔn)規(guī)定了智能計(jì)時(shí)計(jì)量水控設(shè)備的術(shù)語(yǔ)和定義、技術(shù)要求、試驗(yàn)方法、檢驗(yàn)規(guī)則、標(biāo)志、包裝、運(yùn)輸和貯存等。 本標(biāo)準(zhǔn)適用于由以集成電路卡(IC卡)為信息傳遞載體的智能計(jì)時(shí)計(jì)量水控設(shè)備。
Intelligent timing metering water control equipment
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